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TTTC's Electronic Broadcasting Service |
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21st IEEE International Mixed-Signal Testing Workshop
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Under the umbrella of the
1st IEEE Federative Event on Design for Robustness http://tima.imag.fr/conferences/fedfro/fedfro16 |
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CALL FOR PAPERS
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The role of nano-electronic systems is rapidly expanding in every facet of modern life. To interact with environment and users the Integrated Circuits need analog, mixed-signal, RF or MEMS blocks. These blocks could represent a low part of the chip area but have a major impact on IC Yield and reliability. Indeed, one of the major bottlenecks nowadays for nano-electonics systems is the post-manufacturing testing of their analog, mixed-signal, RF, and MEMS functions, in order to guarantee outgoing quality while not sacrificing yield. Testing such functions is accounting for a large portion of the overall manufacturing cost. |
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Submissions: Submissions should be via the workshop web-site and consist of either an extended summary of at least 750 words or preferably a complete 6-page paper. The workshop will produce electronic formal proceedings with an ISBN number which will become available in the IEEE Xplore digital library. |
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Submission deadline: March 25, 2016 |
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| Additional Information | |
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A selection of papers will be invited to a special issue of Springer Journal of Electronic Testing: Theory and Applications (JETTA). |
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| Committee | |
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General Chair S. Bernard, LIRMM, FR Program Chairs M. Barragan, TIMA, FR W. Eisenstadt, U. Florida, USA Local Chair L. Balado, UPC, ES Special Session M. Comte, LIRMM, FR H.-G. Stratigopoulos, LIP6, FR Publication K. Huang, SDSU, USA Finance V. Kerzérho, LIRMM, FR Publicity S. Mir, TIMA, FR A. Todri-Sanial, LIRMM, FR Program Committee
Steering Committee
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| For more information, visit us on the web at: http://tima.imag.fr/conferences/imstw/imstw16/ |
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The 21st International Mixed-Signal Testing Workshop 2016 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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